X-eye SF160ACT is a high-resolution micro-focus X-ray system for the inspection of Semiconductor, PCB assembly, and electronics. With its superior X-ray imaging, micro-scale hidden defects can be detected in high resolution. The system equips 160kV micro-focus open tube with 1um spot size. The system can magnify the object up to 2,800x and display the X-ray image at any angle using 6-axis manipulator configuration. 3D CT visualizes all hidden structure and even micro-scale defects inside the object.
SEC unique oblique CT realizes high-magnified 3D CT visualization of large-size. Typically, it is known that CT scanning is limited by the object size, but SEC oblique CT technology overcomes the size limitation and can be adapted to BGAs on large-size PCBs, and even semiconductor wafers.
Major Features:
Max. tube voltage of 160kV
Detail detectability of < Max. inspection area of 460mm x 510mm
Max. magnification up to 2,800x
Up to 60° oblique with AFTTM Function.
Double navigation function
Operator-friendly user interface
Automatic BGA Inspection Module
Standard 24“ widescreen LCD Monitor
CT Features:
Fast CT recon. time of <10sec
Min. Voxel size of <5 um
Max. 2048 x 2048 x 2048 3D recon. matrix
Easy CT software configuration.
3D Measurement with analysis features
Virtual animation generator
Create 3D-Viewer CD
Ready for Reverse Engineering
Intel® i7 3.07GHz Workstation
Dual 24”LCD Monitor
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